Growing pressure to improve IC reliability in safety- and mission-critical applications is fueling demand for custom automated test pattern generation (ATPG) to detect small timing delays, and for ...

Ever since the earliest semiconductor devices, silicon health has been a concern. Systems manufacturers wanted to be sure that their chips worked properly before being soldered onto printed circuit ...

To estimate the semiconductor device outgoing quality level as a function of delay test robustness applied in manufacturing, Cadence Design Systems Inc. and the Semiconductor Technology Academic ...